University of Notre Dame
Browse
- No file added yet -

Methods and systems for measuring an aberated wave front

Download (1.29 MB)
standard
posted on 2016-06-07, 00:00 authored by Alan B. Cain, Eric J. Jumper, Stanislav Gordeyev, Terry Ng
Methods and systems are described for a system for measuring aberrations in a wave front. In the improved system multiple closely-spaced, small-aperture laser beams traverse an aberrating flow that introduces deflections of small-aperture laser beams from which aberrated wavefronts can be constructed. These beams may then be focused on position sensing devices using focusing lenses. The position sensing devices may then detect the positions of these beams and a difference between the detected position and the unaberrated position of the beams detected. This information may then be used to determine information regarding the optical aberrations introduced by the flow that may be used, for example, in improving communications systems and/or laser weapon systems.

History

Patent Number

US 7295292 B2

Other Application

11/132,312

Inventor

Eric J. Jumper Stanislav Gordeyev Alan B. Cain Terry Ng

Inventor from Local Institution

Eric J. Jumper Stanislav Gordeyev

Assignee

University of Notre Dame Du Lac

Date Modified

2017-08-01

Language

  • English

Claims

33

Publisher

United States Patent and Trademark Office

Cooperative Patent Classification Codes

G01J 9/00 (20130101); G01M 11/00 (20130101); G01M 9/065 (20130101)

Contributor

Eric J. Jumper|Stanislav Gordeyev

International Patent Classification Codes

G01B 9/00 (20060101); G01J 1/00 (20060101); G01N 21/00 (20060101)

US Patent Classification Codes

356/124; 250/201.9; 250/202; 356/121; 356/27; 356/614; 356/73; 73/1.16

Usage metrics

    Patents

    Categories

    No categories selected

    Keywords

    Licence

    Exports

    RefWorks
    BibTeX
    Ref. manager
    Endnote
    DataCite
    NLM
    DC