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  • Inventor(s):
    Jean-Baptiste Thibault, Xue Rui, Somesh Srivastava, Ken D. Sauer, Lin Fu, Charles A. Bouman
    Patent Number:
    US 9261467 B2
    Description:

    A system and method include acquisition of projection data from a scanned object, the set of projection data comprising a plurality of projection measurements. The system and method also include calculation of a set of modified statistical weights from the projection data, wherein a respective modified statistical weight of the set of modified statistical weights comprises a deviation from an inverse variance of a corresponding projection measurement of the projection data. The system and met…

    Date Issued:
    2016-02-16
    Record Visibility:
    Public
    Resource Type
    Patent