US7295292.pdf (1.29 MB)
Methods and systems for measuring an aberated wave front
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posted on 2016-06-07, 00:00 authored by Alan B. Cain, Eric J. Jumper, Stanislav Gordeyev, Terry NgMethods and systems are described for a system for measuring aberrations in a wave front. In the improved system multiple closely-spaced, small-aperture laser beams traverse an aberrating flow that introduces deflections of small-aperture laser beams from which aberrated wavefronts can be constructed. These beams may then be focused on position sensing devices using focusing lenses. The position sensing devices may then detect the positions of these beams and a difference between the detected position and the unaberrated position of the beams detected. This information may then be used to determine information regarding the optical aberrations introduced by the flow that may be used, for example, in improving communications systems and/or laser weapon systems.
History
Patent Number
US 7295292 B2Other Application
11/132,312Inventor
Eric J. Jumper Stanislav Gordeyev Alan B. Cain Terry NgInventor from Local Institution
Eric J. Jumper Stanislav GordeyevAssignee
University of Notre Dame Du LacDate Modified
2017-08-01Language
- English
Claims
33Publisher
United States Patent and Trademark OfficeCooperative Patent Classification Codes
G01J 9/00 (20130101); G01M 11/00 (20130101); G01M 9/065 (20130101)Contributor
Eric J. Jumper|Stanislav GordeyevInternational Patent Classification Codes
G01B 9/00 (20060101); G01J 1/00 (20060101); G01N 21/00 (20060101)US Patent Classification Codes
356/124; 250/201.9; 250/202; 356/121; 356/27; 356/614; 356/73; 73/1.16Usage metrics
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