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Low voltage tunnel field-effect transistor (TFET) and method of making same

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posted on 2017-06-22, 00:00 authored by Alan C. Seabaugh, Guangle Zhou, Huili (Grace) Xing, Mark A. Wistey, Patrick Fay, Siyuranga Koswatta, Yeqing Lu
A low voltage tunnel field effect transistor includes a p-n tunnel junction, a gate-dielectric, a gate, a source-contact, and a drain-contact. The p-n tunnel junction includes a depletion region interfacing together a source-layer and a drain-layer. The depletion region includes a source-tunneling-region of the source-layer and a drain-tunneling-region of the drain-layer. When no external electric field is imposed, the depletion region of the p-n tunnel junction has an internal electric field that substantially points towards the source-tunneling-region and the drain-tunneling-region. The gate-dielectric is interfaced directly onto the drain-tunneling-region such that the drain-tunneling-region is between the source-tunneling-region and the gate-dielectric. The gate is interfaced onto the gate-dielectric such that the gate is configured to impose an external electric field which is oriented substantially in parallel to the internal electric field of the depletion region.

History

Patent Number

US 8796733 B2

Other Application

13/206,187

Inventor

Alan C. Seabaugh Patrick Fay Huili (Grace) Xing Guangle Zhou Yeqing Lu Mark A. Wistey Siyuranga Koswatta

Inventor from Local Institution

Alan C. Seabaugh Patrick Fay Huili (Grace) Xing Guangle Zhou Yeqing Lu Mark A. Wistey

Assignee

University of Notre Dame du Lac International Business Machines Corporation (Armonk, NY)

Date Modified

2017-06-22

Language

  • English

Claims

16

Prior Publication Number

US 20120032227 A1

Publisher

U.S. Patent and Trademark Office

Cooperative Patent Classification Codes

H01L 29/7391 (20130101)

Contributor

Alan C. Seabaugh|Patrick Fay|Huili (Grace) Xing|Guangle Zhou|Yeqing Lu|Mark A. Wistey

International Patent Classification Codes

H01L 29/66 (20060101)

US Patent Classification Codes

257/183

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