TEM Investigations of Ion-Irradiated Cerium Oxide Thin Film

Article

Abstract

Cerium oxide (CeO2) is of great interest due to its unique properties. The formation of a single oxygen-vacancy during the reduction of CeO2 to Ce2O3 increases the Ce3+ fraction [1,2,3]. The valence and defect structures of CeO2 are dynamic and can change spontaneously or in response to physical parameters such as temperature, partial oxygen pressure, doping with other ions, and on applying an electric field or surface stress. Nano-scale CeO2 particles possess an increased Ce3+ concentration in comparison to larger particles since the defect concentration is augmented at the surface. The simultaneous presence of Ce3+ and Ce4+ mixed valence states impart properties of ceria that have been deployed in various fields such as fuel cell materials, automotive catalysis, oxygen storage, and biological reactive oxygen species scavenging [4,5].

Attributes

Attribute NameValues
Creator
  • Khachatur Manukyan

Journal or Work Title
  • Microscopy and Microanalysis

Volume
  • 25

Issue
  • S2

First Page
  • 1620

Last Page
  • 1621

ISSN
  • 1431-9276

ISBN
  • 1431927619

Publication Date
  • 2019-08

Subject
  • Titan TEM

Publisher
  • Cambridge

Date Created
  • 2019-09-25

Language
  • English

Departments and Units
Record Visibility and Access Public
Content License
  • All rights reserved

Digital Object Identifier

doi:10.1017/S1431927619008833

This DOI is the best way to cite this article.